Materials Characterisation

 

High-Temperature Laser Confocal Microscopy 

High Temperature Laser Confocal Microscopy (HTLCM) can be used to carry out following studies,Solidification of metals; Crystallization of slags and mould fluxes; Inclusion behaviour and dissolutions at the gas/metal and/or slag/metal interface and within the slag phase; Reduction and oxidation; Reaction kinetics (in combination with mass spectrometry); and Mechanisms of dissolution and dissolution kinetics. 

For more information, contact Mark Reid on (02) 42214859.

 

Transmission Electron Microscope TEM

The JEOL 200kV Scanning Transmission Electron Microscopy can be used for structural analysis with a resolution of 0.16nm. In addition to conventional bright field microscopy, it is capable of performing a variety of other useful functions, such as Electron Diffraction, Dark Field Microscopy and Energy Dispersive X-ray Spectrometry.

For more information, contact David Wexler on (02) 42214739.

 

Thermal Field Emission Scanning Electron Microscope

The JEOL JSM-7001F, Thermal Field Emission SEM, is the ideal platform for demanding analytical applications as well as those requiring high resolution and ease-of-use. In addition, it features Electron Backscatter Diffraction EBSD for crystallographic identification.The JSM-7001F has a large, 5-axis, fully eucentric, motorized, automated specimen stage, a one-action specimen exchange airlock, small probe diameter even at large probe current and low voltage, and expandability with ideal geometry for EDS, WDS, EBSP, and CL. 

For more information, contact Azdiar Gazder on (02) 42215904.

 

Scanning Electron Microscopy

The JEOL JSM-6490LA is a high-performance, scanning electron microscope with an embedded energy dispersive X-ray analyzer (EDS) which allows for seamless observation and elemental analysis. The microscope has a high resolution of 3.0nm. The low vacuum mode, allows for observation of specimens which cannot be viewed at high vacuum due to excessive water content or due to a non-conductive surface. 

For more information, contact Nick Mackie on (02) 42213015.

 

Atomic Force Microscopy

The atomic force microscope (AFM) is a very high-resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer. The AFM can be used to image and manipulate atoms and structures on a variety of surfaces. The AFM is the most powerful tools for surface metrology, measuring 3D surface topography, measuring surface features whose dimensions range from interatomic spacing to a tenth of a millimeter.

 For more information, contact Greg Tillman on (02) 42213024.

 

Optical Metallography

We have a fully equipped Metallography Laboratory with automated polishing machines aswell as a wide range of bright field and fluorescent microscopes, including high-resolution imaging capture facilities.

 

For more information, contact Greg Tillman on (02) 42213024.

                                                                               

X-Ray Diffraction (XRD) including Texture Goniometry

We have three different XRD units for phase identification and quantification both at ambient and elevated temperatures. In addition, a texture goniometer will soon be available, which is an advanced tool for texture characterization of steels, light alloys, nanomaterials, superconductors and minerals.

 

For more information, contact David Wexler (02) 42214739.

 

Leco HF400 Carbon and Sulphur Analyser

Our Leco HF 400 Analysis System allows the quantitative measurement (ASTM E1019) of Carbon and Sulphur contents of steels by combustion and IR analysis. Even very low contents can be detected.

For more information, contact Brian Monaghan on (02) 42214580.

 

Differential Scanning Calorimetry (DSC)

The TA Q100 Differential Scanning Calorimetry permits the direct calorimetric measurement of specific heats, phase transition enthalpies and other properties such as glass transition temperature and curing processes in polymers.

For more information, contact Hugh Brown on (02) 42213820.

 

Dynamic Mechanical Analyser (DMA)

The TA Q800 Dynamic Mechanical Analyser can determine the mechanical properties for a wide range of materials. In particular viscoelastic polymers and composites. Normally tests are performed in tension but the Q800 has several other fixtures to perform tests such as ‘3 point bend’ and flexure testings.

For more information, contact Hugh Brown on (02) 42213820.